发明名称 TRANSMISSION ELECTRON MICROSCOPE IMAGE OBSERVATION DEVICE
摘要 PROBLEM TO BE SOLVED: To facilitate adjustment of sensitivity in a camera detecting means, expansion of a dynamic range, and acquiring operation and adjustment of an image. SOLUTION: A transmission electron microscope image observation device indicating a transmission electron microscopic image of a sample 1 on a monitor 18 is provided with a camera detecting means constructed of a slit 10 limiting an opening part, a fluorescent screen 11 arranged below the slit 10, and a line sensor 12 arranged below the fluorescent screen 11 along the slit 10, image forming means 2-4 forming a transmission electron microscopic image of the sample 1 on the slit 10, a scanning means 5 scanning the transmission electron microscopic image formed on the slit 10 relatively, and an image outputting means 15 sequentially acquiring a signal from the line sensor 12 as an image signal into a frame memory in response to scanning by the scanning means 5 and outputting an image of the captured frame memory.
申请公布号 JP2000149848(A) 申请公布日期 2000.05.30
申请号 JP19980324740 申请日期 1998.11.16
申请人 JEOL LTD 发明人 OKURA YOSHIHIRO
分类号 H01J37/22;(IPC1-7):H01J37/22 主分类号 H01J37/22
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