发明名称 Device for sensing data in a multi-bit memory cell using a multistep current source
摘要 A device and method for sensing data in a multi-bit memory cell of a memory cell array unit is provided where each memory cell has at least two threshold voltage levels. The device can include a multistep current source unit to provide quantized voltages, each having a width smaller than a threshold voltage distribution in a selected memory cell, according to a current flowing through the selected memory cell. An analog-to-digital converter compares the quantized voltages from the multistep current source unit with a plurality of reference voltages to provide a state of the memory cell in binary form. The device and method for sensing data in the multi-bit memory cell uses the quantized voltages to increase sensing reliability, increases sensing speed and increases a gap between the quantized voltages relative to the threshold voltage distribution.
申请公布号 US6069821(A) 申请公布日期 2000.05.30
申请号 US19990427273 申请日期 1999.10.26
申请人 HYUNDAI ELECTRONICS INDUSTRIES CO., LTD. 发明人 JUN, SI BUM;KIM, DAE MANN;CHOI, WOONG LIM
分类号 G11C16/02;G11C11/56;G11C16/00;G11C16/06;(IPC1-7):G11C16/06 主分类号 G11C16/02
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