发明名称 METHOD OF PRODUCING SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method for producing a semiconductor device is provided to reduce the number of preparation processes without need of transfer gate sacrificial oxide and to reduce divot, degradation and defects of an isolation part. CONSTITUTION: A producing method comprising: forming an oxide layer(2) on a semiconductor device substrate(1); forming a silicon nitride layer(3) on the oxide layer; forming an isolation area(4) in the substrate; removing the silicon nitride layer; injecting dopant ions into the substrate by using the oxide layer as a screen; forming a gate oxide layer(9) on the substrate after removing the oxide layer; filling in the isolation area with TEOS(Tetraethylorthosilicate), other oxides or insulators; and polishing the TEOS, other oxides or the insulators.
申请公布号 KR20000028655(A) 申请公布日期 2000.05.25
申请号 KR19990038816 申请日期 1999.09.11
申请人 INTERNATIONAL BUSINESS MACHINED CORPORATION 发明人 HOLYHAN KEVIN M.;LAN KINJED H.
分类号 H01L21/335;H01L21/28;H01L21/314;H01L21/316;H01L21/762;H01L21/8238;(IPC1-7):H01L21/335 主分类号 H01L21/335
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