发明名称 PRODUCING METHOD AND SYSTEM OF SEMICONDUCTOR DEVICE
摘要 PURPOSE: A producing method of a semiconductor is provided to remove a sub generated object generated from WF6 and NH3 gas by washing on the spot and keeping a filming chamber unit at a proper temperature that the sub generated object is not remained. CONSTITUTION: A method for producing a semiconductor includes a process for contacting a first material gas including a tungsten atom to a processed body and not contacting a second material gas including a nitride atom to the processed body and a filming process for producing the semiconductor device by forming a nitride tungsten film in the processed body using the first and second raw material gas. Herein, the process pressure of the processed body in the process is 0.1 to 20 Torr, and the temperature of the processed body is 300 to 500°C. Thereby, the nitride tungsten film is prevented from being peeled off from a lower layer on a heat process after filming.
申请公布号 KR20000029332(A) 申请公布日期 2000.05.25
申请号 KR19990046706 申请日期 1999.10.26
申请人 TOKYO ELECTRON LTD. 发明人 YAMASAKI HIDEAKI;YONEJAWA SATOSHI;ARIMASU SUMU;GAWANO YUMIKO;DACHIBANA MITHUHIRO;HOSODA GEIJO
分类号 H01L21/205;C23C16/02;C23C16/34;C23C16/44;C23C16/455;H01L21/285;H01L21/3205;(IPC1-7):H01L21/205 主分类号 H01L21/205
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