发明名称 METHOD FOR INSPECTING INFERIORITY IN SHAPE
摘要 A method for inspecting inferiority in shape of an object is provided, which is accomplished through an inspection image obtained from an inspection object. The object shape inferiority inspection method includes the steps of: preparing at least one reference image for judgement as to shape inferiority in the inspection object considering an allowable error for shape; obtaining the inspection image from the inspection object; comparing grayscales of each one part, at least, of portions where the reference image and the inspection image mutually correspond, and judging whether inferiority in shape of the inspection object exists, based on the result of the grayscale comparison. Accordingly, the time required for inspecting inferiority in shape of an object could be greatly reduced and shape inferiority over the entire area of an object can be detected.
申请公布号 WO0028309(A1) 申请公布日期 2000.05.18
申请号 WO1999KR00663 申请日期 1999.11.05
申请人 SAMSUNG ELECTRONICS CO., LTD.;KIM, MYOUNG, JIN 发明人 KIM, MYOUNG, JIN
分类号 G01N21/956;(IPC1-7):G01N21/88;G01B11/16;G01B11/24 主分类号 G01N21/956
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