发明名称 |
Wafer cleaning system with progressive megasonic wave |
摘要 |
<p>Improved megasonic cleaning is obtained by use of an apparatus containing a plurality of transducers arranged to transmit a progressive megasonic wave through a liquid containing a planar surface of an object. The progression of the wave is preferably such that particles are carried by the wave toward the toward the edge of the wafer. The processes and apparatus are especially useful for cleaning wafers in the course of manufacturing integrated circuit chips.</p> |
申请公布号 |
EP1000673(A2) |
申请公布日期 |
2000.05.17 |
申请号 |
EP19990307796 |
申请日期 |
1999.10.04 |
申请人 |
INTERNATIONAL BUSINESS MACHINES;KABUSHIKI KAISHA TOSHIBA |
发明人 |
AKATSU, HIROYUKI;NADAHARA, SOICHI |
分类号 |
B08B3/12;H01L21/00;H01L21/304;(IPC1-7):B08B3/12 |
主分类号 |
B08B3/12 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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