发明名称 |
SEMICONDUCTOR APPARATUS EQUIPPED WITH AN ELECTROSTATIC DISCHARGE PROTECTION DEVICE. |
摘要 |
PURPOSE: An apparatus is provided to improve latch-up and ESD characteristics and to enhance the reliability and characteristics of a semiconductor device by forming a new ESD current path with lowering a breakdown voltage. CONSTITUTION: An ESD protection device has a first conductive-type MOS and a second conductive -type MOS having a source region connected to a data output pin. Second conductive-type well guide rings 10 are formed on a first conductive-type substrate planned for an ESD region. First and second conductive-type wells are formed inside the second conductive-type well guide rings(10). A second conductive-type well pickup(14) is formed between the second conductive-type well and the second conductive-type well guide rings(10).
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申请公布号 |
KR20000027644(A) |
申请公布日期 |
2000.05.15 |
申请号 |
KR19980045601 |
申请日期 |
1998.10.28 |
申请人 |
HYUNDAI ELECTRONICS IND. CO., LTD. |
发明人 |
JEONG, HAN;UM, JAE CHEOL |
分类号 |
H01L27/06;(IPC1-7):H01L27/06 |
主分类号 |
H01L27/06 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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