发明名称 METHOD OF FORMING PAD METAL OF SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method of forming a pad metal of a semiconductor device is provided to prevent gold from penetrating a semiconductor substrate in manufacturing an alloy by adding platinum between titanium and gold and forming the pad metal to use the platinum as a barrier metal. CONSTITUTION: A method of forming a pad metal(140) comprises the steps of: forming a passivation layer(123) on the entire surface after forming a semiconductor element in an active region(120); eliminating a selected region of the passivation layer and forming a P-OHmic metal(126) in the eliminated region; and sequentially forming titanium(131), platinum(134) and gold(137) on the entire structure including the passivation layer and the P-OHmic metal and forming a pad metal(140) composed of titanium, platinum and gold by patterning and alloy process.
申请公布号 KR20000027270(A) 申请公布日期 2000.05.15
申请号 KR19980045172 申请日期 1998.10.27
申请人 HYUNDAI ELECTRONICS IND. CO., LTD. 发明人 KANG, JUNG GU
分类号 H01L21/28;(IPC1-7):H01L21/28 主分类号 H01L21/28
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