发明名称 |
METHOD OF FORMING PAD METAL OF SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method of forming a pad metal of a semiconductor device is provided to prevent gold from penetrating a semiconductor substrate in manufacturing an alloy by adding platinum between titanium and gold and forming the pad metal to use the platinum as a barrier metal. CONSTITUTION: A method of forming a pad metal(140) comprises the steps of: forming a passivation layer(123) on the entire surface after forming a semiconductor element in an active region(120); eliminating a selected region of the passivation layer and forming a P-OHmic metal(126) in the eliminated region; and sequentially forming titanium(131), platinum(134) and gold(137) on the entire structure including the passivation layer and the P-OHmic metal and forming a pad metal(140) composed of titanium, platinum and gold by patterning and alloy process.
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申请公布号 |
KR20000027270(A) |
申请公布日期 |
2000.05.15 |
申请号 |
KR19980045172 |
申请日期 |
1998.10.27 |
申请人 |
HYUNDAI ELECTRONICS IND. CO., LTD. |
发明人 |
KANG, JUNG GU |
分类号 |
H01L21/28;(IPC1-7):H01L21/28 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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