| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor testing device capable of generating the test patterns of test signals at faster speed. SOLUTION: A semiconductor testing device is provided with a sequence controlling part 10 to control the sequence of pattern generating instructions described in a program and output the pattern generating instructions according to the sequence, a plurality of serially connected pattern generators 14, 16, 18, and 20 to generate patterns based on the pattern generating instructions outputted from the sequence controlling part 10, and a multiplexing circuit 28 to multiplex and output the output of the pattern generators 14, 16, 18, and 20. In addition, the semiconductor testing device is provided with phase regulating circuits 22, 24, and 26 to each regulate the phase of the output of the pattern generators 14, 16, 18, and 20. |
