发明名称 HYDROGENATION METHOD OF THIN-FILM TRANSISTOR
摘要 PROBLEM TO BE SOLVED: To improve hydrogenation treatment of a polycrystalline semiconductor thin film and obtain a state of high mobility for a thin-film transistor. SOLUTION: When a thin-film transistor is manufactured by forming a lamination structure on an insulating substrate 11, which a structure includes a polycrystalline semiconductor thin film, a gate insulating film which is in contact with one surface side of the thin film, and a gate electrode stacked on the semiconductor thin film via the gate insulating film, active hydrogen is formed by bringing a material gas containing hydrogen into contact with a catalyzer 73 heated at 1,000 deg.C to 2,000 deg.C, and crystal defects are repaired by introducing active hydrogen in the semiconductor thin film.
申请公布号 JP2000133806(A) 申请公布日期 2000.05.12
申请号 JP19980306205 申请日期 1998.10.28
申请人 SONY CORP 发明人 SUGANO YUKIYASU;KUNII MASABUMI;URAZONO TAKENOBU
分类号 H01L29/786;H01L21/336;(IPC1-7):H01L29/786 主分类号 H01L29/786
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