发明名称 |
STRUCTURE OF SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME |
摘要 |
PURPOSE: A structure of a semiconductor device and a manufacturing method thereof are provided to reduce overall size of a semiconductor device efficiently by forming structure of a via hole in a double cubic structure. CONSTITUTION: A field oxide film(22) is formed on a device isolation region of a semiconductor substrate(21). Transistors are formed on active regions isolated by the field oxide film(22). An ILD(interlayer dielectric) layer(23) is formed to have contact holes selectively at entire surface. A lower wiring layer is formed to be in contact with partial region of the transistors. A first IMD(intermetal dielectric) layer(24) is formed to have a first via hole with a first width. A first tungsten plug layer is formed by burying the first via hole of the first IMD layer(24) completely. A second IMD layer(28) is formed to have a second via hole with a second width on the first tungsten plug layer. A second tungsten plug layer is formed by burying the second via hole of the second IMD layer(28). A metal wire layer(30) is formed to be in contact with the second tungsten plug on the second IMD layer(28).
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申请公布号 |
KR100252914(B1) |
申请公布日期 |
2000.05.01 |
申请号 |
KR19970070593 |
申请日期 |
1997.12.19 |
申请人 |
HYUNDAI MICRO ELECTRONICS CO.,LTD. |
发明人 |
PARK, BAN-SUK |
分类号 |
H01L21/28;(IPC1-7):H01L21/28 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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