发明名称 STRUCTURE OF SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME
摘要 PURPOSE: A structure of a semiconductor device and a manufacturing method thereof are provided to reduce overall size of a semiconductor device efficiently by forming structure of a via hole in a double cubic structure. CONSTITUTION: A field oxide film(22) is formed on a device isolation region of a semiconductor substrate(21). Transistors are formed on active regions isolated by the field oxide film(22). An ILD(interlayer dielectric) layer(23) is formed to have contact holes selectively at entire surface. A lower wiring layer is formed to be in contact with partial region of the transistors. A first IMD(intermetal dielectric) layer(24) is formed to have a first via hole with a first width. A first tungsten plug layer is formed by burying the first via hole of the first IMD layer(24) completely. A second IMD layer(28) is formed to have a second via hole with a second width on the first tungsten plug layer. A second tungsten plug layer is formed by burying the second via hole of the second IMD layer(28). A metal wire layer(30) is formed to be in contact with the second tungsten plug on the second IMD layer(28).
申请公布号 KR100252914(B1) 申请公布日期 2000.05.01
申请号 KR19970070593 申请日期 1997.12.19
申请人 HYUNDAI MICRO ELECTRONICS CO.,LTD. 发明人 PARK, BAN-SUK
分类号 H01L21/28;(IPC1-7):H01L21/28 主分类号 H01L21/28
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