发明名称 HIGH SENSITIVITY ATR ANALYSIS METHOD AND OPTICAL PRISM THEREFOR
摘要 <p>PROBLEM TO BE SOLVED: To provide an ATR analysis method improved to perform a practical analysis with high sensitivity and an optical prism therefore. SOLUTION: A sample 101 is arranged at least on the first reflective face 7 of an optical prism 100 having a light incoming window 5, a light outgoing window 6, the first reflective face 7, and a second reflective face 8 for multiple reflecting the light multiple reflected on the first reflective face 7 at least one more time on the first reflective face 7. An incident light 2 entering from the incoming window 5 is reflected totally on the interface between the first reflective face 7 of the optical prism 100 and the sample 101 and the outgoing light 3 outgoing from the outgoing window 6 is detected by a detector 4 thus analyzing the sample 101.</p>
申请公布号 JP2000111474(A) 申请公布日期 2000.04.21
申请号 JP19980284841 申请日期 1998.10.07
申请人 MITSUBISHI ELECTRIC CORP 发明人 UMEMURA SONOKO;FUJINO NAOHIKO
分类号 G01N21/27;G01N21/552;(IPC1-7):G01N21/27 主分类号 G01N21/27
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