| 摘要 |
PROBLEM TO BE SOLVED: To shorten processing time regardless of an output data form of a measuring object device, and to reduce storage capacity of data. SOLUTION: An IC tester has a switching unit 3 for switching an input passage of serial data and parallel data, a serial-parallel converter 5 for converting the serial data into the parallel data and a data converter 7 for rearranging the serial data in weight order of a bit, and when digital output from a DUT(device under test) 1 is a serial form, an address in the data converter 7 is designated by the parallel data from the serial-parallel converter 5 so that the parallel data of the address is written in a prescribe address of 1 in a storage device 9. Thus, there is no need to perform arithmetic processing for rearranging data one bit by one bit for converting the serial data into the parallel data.
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