发明名称 |
MANUFACTURE OF POLYCRYSTALLINE SILICON |
摘要 |
<p>PROBLEM TO BE SOLVED: To obtain a sufficiently large fluence margin of a laser beam used in laser annealing to crystallize amorphous silicon, to attain high electric field mobility and to ensure a high yield. SOLUTION: A thin film transistor applied for switching of a pixel of a liquid crystal display has a polycrystalline silicon layer which is formed by crystallization with laser annealing of amorphous silicon deposited on a glass substrate 1. A characteristic curve of intensity distribution of a laser beam used in the laser annealing has a maximum shifted to the upstream side of a moving direction of the glass substrate 1. The amorphous silicon is irradiated with the laser beam from the high intensity part in the laser annealing of the amorphous silicon.</p> |
申请公布号 |
JP2000111950(A) |
申请公布日期 |
2000.04.21 |
申请号 |
JP19980284268 |
申请日期 |
1998.10.06 |
申请人 |
TOSHIBA CORP |
发明人 |
MIHASHI HIROSHI;KAWAHISA YASUTO |
分类号 |
G02F1/136;G02F1/1368;H01L21/20;H01L21/336;H01L29/786;(IPC1-7):G02F1/136 |
主分类号 |
G02F1/136 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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