发明名称 MANUFACTURE OF POLYCRYSTALLINE SILICON
摘要 <p>PROBLEM TO BE SOLVED: To obtain a sufficiently large fluence margin of a laser beam used in laser annealing to crystallize amorphous silicon, to attain high electric field mobility and to ensure a high yield. SOLUTION: A thin film transistor applied for switching of a pixel of a liquid crystal display has a polycrystalline silicon layer which is formed by crystallization with laser annealing of amorphous silicon deposited on a glass substrate 1. A characteristic curve of intensity distribution of a laser beam used in the laser annealing has a maximum shifted to the upstream side of a moving direction of the glass substrate 1. The amorphous silicon is irradiated with the laser beam from the high intensity part in the laser annealing of the amorphous silicon.</p>
申请公布号 JP2000111950(A) 申请公布日期 2000.04.21
申请号 JP19980284268 申请日期 1998.10.06
申请人 TOSHIBA CORP 发明人 MIHASHI HIROSHI;KAWAHISA YASUTO
分类号 G02F1/136;G02F1/1368;H01L21/20;H01L21/336;H01L29/786;(IPC1-7):G02F1/136 主分类号 G02F1/136
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