发明名称 Method and apparatus for semiconductor filming
摘要 A method of semiconductor filming wherein a thin film is deposited on a wafer under an atmospheric pressure, which comprises the steps of simultaneously supplying a reactive gas and an inert gas to a reaction tube and maintaining a partial pressure of the reactive gas constant by adjusting the flow rates of those gases, whereby stability in film quality is improved.
申请公布号 US6051072(A) 申请公布日期 2000.04.18
申请号 US19980080654 申请日期 1998.05.18
申请人 KOKUSAI ELECTRIC CO., LTD. 发明人 HARADA, TORU
分类号 C23C8/28;H01L21/31;H01L21/316;(IPC1-7):C23C16/00 主分类号 C23C8/28
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