发明名称 |
PLASMA ETCHING CHAMBER FOR MANUFACTURING SEMICONDUCTOR DEVICES |
摘要 |
PURPOSE: A plasma etching chamber is provided to easily identify a leak of cooling water for controlling temperature of the etching chamber by using a transparent cover mounted on the outer wall of the process chamber. CONSTITUTION: A plasma etching chamber(10) includes a cover(12) made of transparent materials formed at outside of the etching chamber(10). The transparent cover(12) further comprises a plurality of water emitting holes(14) for emitting waters in accordance with a leak of a cooling water. By identifying inner state of the etching chamber(10) with naked eye using the transparent cover(12), the processing failure is previously prevented.
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申请公布号 |
KR20000020891(A) |
申请公布日期 |
2000.04.15 |
申请号 |
KR19980039682 |
申请日期 |
1998.09.24 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
CHANG, BONG JUN |
分类号 |
H01L21/306;(IPC1-7):H01L21/306 |
主分类号 |
H01L21/306 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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