发明名称 PLASMA ETCHING CHAMBER FOR MANUFACTURING SEMICONDUCTOR DEVICES
摘要 PURPOSE: A plasma etching chamber is provided to easily identify a leak of cooling water for controlling temperature of the etching chamber by using a transparent cover mounted on the outer wall of the process chamber. CONSTITUTION: A plasma etching chamber(10) includes a cover(12) made of transparent materials formed at outside of the etching chamber(10). The transparent cover(12) further comprises a plurality of water emitting holes(14) for emitting waters in accordance with a leak of a cooling water. By identifying inner state of the etching chamber(10) with naked eye using the transparent cover(12), the processing failure is previously prevented.
申请公布号 KR20000020891(A) 申请公布日期 2000.04.15
申请号 KR19980039682 申请日期 1998.09.24
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 CHANG, BONG JUN
分类号 H01L21/306;(IPC1-7):H01L21/306 主分类号 H01L21/306
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