发明名称 METHOD OF MANUFACTURING SELF ALIGNED CONTACT OF SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method of manufacturing a self-aligned contact of a semiconductor device is provided to optimize a design so that a contact hole can be formed in a desirable position by a spacer process only without using a contact hole mask when forming a line and space pattern. CONSTITUTION: A method of manufacturing a self-aligned contact of a semiconductor device comprises the steps of: forming a line and space pattern while forming a mask for making a contact hole by a spacer process used in the succeeding process; evaporating a conductive thin film on a semiconductor substrate; evaporating a first insulation layer on the conductive thin film; etching the first insulation layer and the conductive thin film in the lower part by using the line and space pattern; evaporating a second insulation layer on the entire surface to the depth in which a gap-fill is realized in the position of the contact hole and not in positions other than the contact hole; and forming the contact hole by making a spacer in the position of the contact hole by etching the entire surface.
申请公布号 KR20000020776(A) 申请公布日期 2000.04.15
申请号 KR19980039524 申请日期 1998.09.23
申请人 HYUNDAI ELECTRONICS IND. CO., LTD. 发明人 AN, CHANG NAM
分类号 H01L21/28;(IPC1-7):H01L21/28 主分类号 H01L21/28
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