发明名称 |
METHOD OF MANUFACTURING SELF ALIGNED CONTACT OF SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method of manufacturing a self-aligned contact of a semiconductor device is provided to optimize a design so that a contact hole can be formed in a desirable position by a spacer process only without using a contact hole mask when forming a line and space pattern. CONSTITUTION: A method of manufacturing a self-aligned contact of a semiconductor device comprises the steps of: forming a line and space pattern while forming a mask for making a contact hole by a spacer process used in the succeeding process; evaporating a conductive thin film on a semiconductor substrate; evaporating a first insulation layer on the conductive thin film; etching the first insulation layer and the conductive thin film in the lower part by using the line and space pattern; evaporating a second insulation layer on the entire surface to the depth in which a gap-fill is realized in the position of the contact hole and not in positions other than the contact hole; and forming the contact hole by making a spacer in the position of the contact hole by etching the entire surface.
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申请公布号 |
KR20000020776(A) |
申请公布日期 |
2000.04.15 |
申请号 |
KR19980039524 |
申请日期 |
1998.09.23 |
申请人 |
HYUNDAI ELECTRONICS IND. CO., LTD. |
发明人 |
AN, CHANG NAM |
分类号 |
H01L21/28;(IPC1-7):H01L21/28 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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