DEVICE FOR TESTING WAFERS,申请号KR19940036819U-传众专利搜索

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发明名称	DEVICE FOR TESTING WAFERS
摘要
申请公布号	KR200177259(Y1)	申请公布日期	2000.04.15
申请号	KR19940036819U	申请日期	1994.12.28
申请人	HYUNDAI MICRO ELECTRONICS CO.,LTD.	发明人	CHOI, JU HO
分类号	H01L21/66;(IPC1-7):H01L21/66	主分类号	H01L21/66
代理机构		代理人
主权项
地址

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