发明名称 |
METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method for manufacturing semiconductor device is provided to minimize the formation of the oxide film in heat treatment of a polysilicon film, thereby previously preventing the generation of the failure and enhancing reliability and productivity. CONSTITUTION: A method for manufacturing semiconductor device comprises a step forming a polysilicon film as a gate of a transistor on a semiconductor substrate, and a heat treatment step. In the heat treatment step, the chamber containing the semiconductor substrate is heated by the temperature to perform heat treatment the polysilicon film in-situ, and at the same time remnant gas within the chamber is removed.
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申请公布号 |
KR20000019929(A) |
申请公布日期 |
2000.04.15 |
申请号 |
KR19980038287 |
申请日期 |
1998.09.16 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KIM, BYUNG DONG;PARK, YEON SIK |
分类号 |
H01L21/28;(IPC1-7):H01L21/28 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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