发明名称 METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method for manufacturing semiconductor device is provided to minimize the formation of the oxide film in heat treatment of a polysilicon film, thereby previously preventing the generation of the failure and enhancing reliability and productivity. CONSTITUTION: A method for manufacturing semiconductor device comprises a step forming a polysilicon film as a gate of a transistor on a semiconductor substrate, and a heat treatment step. In the heat treatment step, the chamber containing the semiconductor substrate is heated by the temperature to perform heat treatment the polysilicon film in-situ, and at the same time remnant gas within the chamber is removed.
申请公布号 KR20000019929(A) 申请公布日期 2000.04.15
申请号 KR19980038287 申请日期 1998.09.16
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM, BYUNG DONG;PARK, YEON SIK
分类号 H01L21/28;(IPC1-7):H01L21/28 主分类号 H01L21/28
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