发明名称 |
METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method for manufacturing semiconductor device is provided to minimize the diffusion of a channel stopper by removing the heat treatment process to the stopper and enhance refresh feature by minimizing the leakage current. CONSTITUTION: A method for manufacturing semiconductor device comprises a step dividing a semiconductor substrate(100) into an active area(102) and an element separating area(104), a step forming a channel area(108) for a transistor, a step sequentially stacking a gate insulation layer(110), a conductive layer and a first insulation layer, a step forming a gate electrode(112), and a step forming a source/drain area(118).
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申请公布号 |
KR20000020010(A) |
申请公布日期 |
2000.04.15 |
申请号 |
KR19980038408 |
申请日期 |
1998.09.17 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
HONG, SEOK WOO;CHOE, WON TAEK |
分类号 |
H01L21/335;(IPC1-7):H01L21/335 |
主分类号 |
H01L21/335 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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