发明名称 METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method for manufacturing semiconductor device is provided to minimize the diffusion of a channel stopper by removing the heat treatment process to the stopper and enhance refresh feature by minimizing the leakage current. CONSTITUTION: A method for manufacturing semiconductor device comprises a step dividing a semiconductor substrate(100) into an active area(102) and an element separating area(104), a step forming a channel area(108) for a transistor, a step sequentially stacking a gate insulation layer(110), a conductive layer and a first insulation layer, a step forming a gate electrode(112), and a step forming a source/drain area(118).
申请公布号 KR20000020010(A) 申请公布日期 2000.04.15
申请号 KR19980038408 申请日期 1998.09.17
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 HONG, SEOK WOO;CHOE, WON TAEK
分类号 H01L21/335;(IPC1-7):H01L21/335 主分类号 H01L21/335
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