发明名称 METHOD FOR FABRICATING A CAPACITOR OF SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method for fabricating a capacitor of a semiconductor device is provided to increase the effective area of the capacitor in a highly integrated semiconductor device to increase the capacitance. CONSTITUTION: A first insulating layer(21) is formed on a semiconductor substrate(20). Then, a first polysilicon layer(22) is formed on the substrate(20) and the first insulating layer(21). Next, a second insulating layer(23) is formed, and ions are implanted into the second insulating layer to form an ion-implanted layer. Then, the second insulating layer is patterned and the second insulating layer is etched to form a second polysilicon layer on the second insulating layer. Next, the second insulating layer and the ion-implanted layer are removed, and a dielectric layer and a third polysilicon layer are formed on the first and second polysilicon layers.
申请公布号 KR100252909(B1) 申请公布日期 2000.04.15
申请号 KR19970015704 申请日期 1997.04.25
申请人 HYUNDAI MICRO ELECTRONICS CO.,LTD. 发明人 KIM, JIN-KU
分类号 H01L27/04;H01L21/02;H01L21/822;H01L21/8242;H01L27/108;(IPC1-7):H01L27/108 主分类号 H01L27/04
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