| 摘要 |
<p>PROBLEM TO BE SOLVED: To provide a device capable of computing accurate net intensity of each fluorescent x-ray from a qualitative analysis result in a scan type fluorescent x-ray analyzer. SOLUTION: This analyzer includes a computing means 11 for computing net intensity of each fluorescent x-ray 7, taking strength measured by a detector 8 as peak intensity in a spectral angle 2θas a physical constant corresponding to a wavelength of each fluorescent x-ray 7 when at least one of an angle difference between the adjacent fluorescent x-rays 7 in a spectral angle 2θread from a qualitative analysis and of an angle difference between the adjacent fluorescent x-rays 7 in the spectral angle 2θas the physical constant corresponding to the wavelength of each fluorescent x-ray 7 is not more than an overlap determination value, based on the resolution of a spectroscope 6 being used.</p> |
