| 摘要 |
PROBLEM TO BE SOLVED: To provide a transmission electron microscope capable of photographing an element distribution image, similarly with a TEM image on a TEM image photographing film. SOLUTION: Electron beam 1, having intensity corresponding to the X-ray intensity data among the X-ray intensity data stored in a memory device once, is emitted from an electron gun 2 synchronously with X, Y scanning signals, and this electron beam is exposed on a film 6 for photographing. With this structure, an element distribution image can be photographed similarly to a normal TEM image.
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