发明名称 ELECTRON BEAM ORBIT MEASURING DEVICE
摘要 PROBLEM TO BE SOLVED: To provide an electron beam orbit measuring device that can accurately measure electron beam orbit and can easily analyze failure cause of a CRT. SOLUTION: This electron beam orbit measuring device 20 is provided with an electromagnetic quadrupole ring 21 and a holding means for holding this. The electromagnetic quadrupole ring 21 has an annular ring portion 22 surrounding a neck portion 12 of a CRT 10 and four coils 24A, 24B, 24C, 24D that are held by this ring portion 22 and are annularly arranged so as to surround the neck portion 12. If the axial direction of the neck portion 12 is set as a Z-axis, an axis orthogonal to the Z-axis is the X-axis, and an axis orthogonal to the Z-axis and the X-axis is the Y-axis, the four coils 24A, 24B, 24C, 24D are arranged on the XY-plane which pass through the X-axis and the Y-axis, are arranged so as to be point-symmetrically with each other in relation to a central position 28 of the annular matter, and are constituted so as to generate a magnetic field whose strength is zero at the central position 28 of the annular matter.
申请公布号 JP2000100330(A) 申请公布日期 2000.04.07
申请号 JP19980271653 申请日期 1998.09.25
申请人 SONY CORP 发明人 KOJIMA AKIHIRO
分类号 H01J9/42;(IPC1-7):H01J9/42 主分类号 H01J9/42
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