| 摘要 |
<p>PROBLEM TO BE SOLVED: To reduce test time and time required for rescue judgment processing by storing a bad block data for indicating a faulty block at a block address that is composed of bits for selecting an address signal being fed to a memory to be tested each time when the faulty block is detected. SOLUTION: When data, which is read from a memory MUT to be tested, mismatch with an expectation value from a pattern generator PG, a mismatched address and the position of a memory cell are stored at a fault analysis memory AFM, and data for indicating a back block is written to a block address corresponding to a block where the mismatched address belongs is written to a first back block memory BBM. When there are a plurality of memories MUT, the test of the memories MUT where a bad block is accessed is masked by the bad data, and the testing of the block can be immediately executed for the memories MUT where other write has been completed.</p> |
