发明名称 Trench capacitor, especially for use with DRAMs, has dielectric material on trench side walls with conducting material, further dielectric material and further conducting material
摘要 The trench capacitor has a substrate (12) containing a trench, a dielectric material (22) on the trench side walls, a first conducting material (20) with a hollow region with outer peripheral sections on the first dielectric material to form a capacitor electrode, a second dielectric material (26) with a hollow region on the inner periphery of the first conducting material and a second conducting material (24) inside the hollow region in the second dielectric to form a capacitor electrode. Independent claims are also included for the following: (i) the production of a trench capacitor; and (ii) a semiconducting structure for a trench capacitor.
申请公布号 DE19929859(A1) 申请公布日期 2000.04.06
申请号 DE19991029859 申请日期 1999.06.30
申请人 SIEMENS AG 发明人 ENDERS, GERHARD;ILG, MATTHIAS;WIDMANN, DIETRICH
分类号 H01L21/8242;H01L27/108;(IPC1-7):H01L21/824 主分类号 H01L21/8242
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