发明名称 |
Trench capacitor, especially for use with DRAMs, has dielectric material on trench side walls with conducting material, further dielectric material and further conducting material |
摘要 |
The trench capacitor has a substrate (12) containing a trench, a dielectric material (22) on the trench side walls, a first conducting material (20) with a hollow region with outer peripheral sections on the first dielectric material to form a capacitor electrode, a second dielectric material (26) with a hollow region on the inner periphery of the first conducting material and a second conducting material (24) inside the hollow region in the second dielectric to form a capacitor electrode. Independent claims are also included for the following: (i) the production of a trench capacitor; and (ii) a semiconducting structure for a trench capacitor.
|
申请公布号 |
DE19929859(A1) |
申请公布日期 |
2000.04.06 |
申请号 |
DE19991029859 |
申请日期 |
1999.06.30 |
申请人 |
SIEMENS AG |
发明人 |
ENDERS, GERHARD;ILG, MATTHIAS;WIDMANN, DIETRICH |
分类号 |
H01L21/8242;H01L27/108;(IPC1-7):H01L21/824 |
主分类号 |
H01L21/8242 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|