发明名称 INSPECTED ITEM PROCESSING SYSTEM
摘要 <p>An object of the present invention is to provide a sample processing system which can, even if the position of the transfer station for moving sample racks between the transport line and a plurality of sample processing units from one to another is changed, smoothly move the sample racks between them. The sample processing system comprises a combination of the rack supply stocker (6), the rack transport line (7), the rack storage stocker (8), and a plurality of sample processing units (3, 4, 5, 100, 200, 300) arranged along the transport line. The parameters of the system configuration such that each of the sample processing units is arranged so as to correspond to what position of the transport line and each of them has what function and the parameters indicating the access positions that the sample rack (10) transported by the transport line is read by the respective sample processing units are input from the parameter input device (11) and registered in the central controller 9 beforehand. On the basis of such stored parameters, the operation control of the transport line (7) and the sample rack movement control between the transport line and each of the sample processing units from one to another are executed. &lt;IMAGE&gt;</p>
申请公布号 EP0990905(A1) 申请公布日期 2000.04.05
申请号 EP19980919522 申请日期 1998.05.08
申请人 HITACHI, LTD. 发明人 TOKIEDA, HITOSHI;IKEDA, TOSHIYUKI;KODAMA, RYUICHIRO
分类号 G01N35/00;G01N35/02;(IPC1-7):G01N35/00;G01N35/04 主分类号 G01N35/00
代理机构 代理人
主权项
地址