发明名称 |
FIELD EFFECT SEMICONDUCTOR DEVICE AND ITS MANUFACTURE |
摘要 |
PROBLEM TO BE SOLVED: To provide a field effect semiconductor device in which the adhesion between an insulating film regulating a gate electrode end and gate metal is improved and yield is improved. SOLUTION: A field effect semiconductor device is provided with a source/ drain electrodes 6 arranged in the prescribed positions of a GaAs substrate 1, a channel region installed in GaAs between the source/drain electrodes 6, a gate electrode 11 which is between the source/drain electrodes 6 and which is brought into Schottky contact with a part of the channel region, and insulating film 7 which electrically insulate the surface of the GaAs substrate and the gate electrode 11 on both sides of the gate electrode 11. The gate electrodes 7 cover the surface of GaAs which constitutes the channel region and a part of the insulating films 7. The lowest metal layer 8 constituting the gate electrode 11 is covered by a second metal layer 9 which is superior in adhesion with the insulating films 7.
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申请公布号 |
JP2000091348(A) |
申请公布日期 |
2000.03.31 |
申请号 |
JP19980254777 |
申请日期 |
1998.09.09 |
申请人 |
SANYO ELECTRIC CO LTD |
发明人 |
MURAI SHIGEYUKI;FUJII SHIGEYOSHI;MATSUSHITA SHIGEHARU;TOMINAGA HISAAKI |
分类号 |
H01L21/285;H01L21/338;H01L29/423;H01L29/47;H01L29/812;H01L29/872;(IPC1-7):H01L21/338 |
主分类号 |
H01L21/285 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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