发明名称 |
Semiconductor component, e.g. containing double-diffused metal-oxide semiconductor transistors, has a region for creating a double drift field from an underlying substrate and from an overlying semiconductor layer towards the region |
摘要 |
A semiconductor component, with a region (22) for creating a drift field (E1, E2) from an underlying substrate (21) and from an overlying semiconductor layer (2) towards the region, is new. A semiconductor component, comprising a first conductivity type semiconductor substrate (21) bearing a semiconductor layer (2) containing different conductivity type zones (4, 5, 7, 8, 10, 18), has a semiconductor region (22) which is located between the substrate and the layer and which creates a drift field (E1, E2) from both the substrate and the layer to the region. Preferred Features: A double-diffused metal-oxide semiconductor (DMOS) transistor with a guard ring (18) is provided in the layer (2). The substrate (21), the region (22) and the guard ring (18) are p-doped. |
申请公布号 |
DE19840031(A1) |
申请公布日期 |
2000.03.16 |
申请号 |
DE1998140031 |
申请日期 |
1998.09.02 |
申请人 |
SIEMENS AG |
发明人 |
VIETZKE, DIRK;STECHER, MATTHIAS;MOSIG, KARSTEN;PERI, HERMANN;SCHWETLICK, WERNER;MAIR, ANDREAS;KOTZ, DIETMAR;KROTSCHECK, THOMAS;GRILZ, REINHOLD |
分类号 |
H01L21/761;H01L29/10;H01L29/78 |
主分类号 |
H01L21/761 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|