发明名称 Process of producing thin film transistor
摘要 A process of producing a thin film transistor of a liquid crystal display device according to the present invention comprises the steps of forming a semiconductor layer on an insulation substrate, stacking an insulation film and a conductive layer on the semiconductor layer, patterning the conductive layer to form a gate electrode, reducing a width of a mask used at formation of the gate electrode in a prescribed amount to form an offset region, implanting highly concentrated impurity ions into a part of the semiconductor layer where there are not the mask or the conductive layer to form an N+-polysilicon layer, re-etching the conductive layer by using the mask used at formation of the gate electrode made narrower by the offset region, and implanting low concentrated impurity ions into the semiconductor layer below the conductor region removed by re-etching to form an N--polysilicon layer.
申请公布号 US6037195(A) 申请公布日期 2000.03.14
申请号 US19980154446 申请日期 1998.09.16
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 TORIYAMA, SHIGETAKA;HIRAYAMA, HIDEO
分类号 H01L21/336;H01L21/77;H01L21/84;H01L29/786;(IPC1-7):H01L21/00 主分类号 H01L21/336
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