| 摘要 |
PROBLEM TO BE SOLVED: To make logical restoration hard for a simple semiconductor device through observation of appearance by providing a rectangular or square data of the sam material as wiring on the intersection of a grid which a basic layout comprises. SOLUTION: If wiring materials 105, 107, and 108 for example, provided in horizontal direction among each grid ranging from wiring grids X1-X5 in vertical direction and wiring grids Y1-Y4 in horizontal direction are assumed as a first layer at the bottom part of a multi-layer interconnection material, a pseudo wiring material 121 is so provided as a grid at a center while a long- side direction as horizontal direction, related to the wiring grids Y1 and Y4 where no same wiring material exists. Again, with wiring materials 101, 102, and 104 allocated in vertical direction assumed as a second layer from the bottom part of the multi-layer interconnection material, related to the wiring grids X1 and X5 where no same wiring material exist and X3 and X4 where the wiring material exist locally, a pseudo wiring material 131 is so allocated as a grid at a center while a long-side direction as vertical direction.
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