发明名称 TERMINAL INSPECTION JIG
摘要 <p>PROBLEM TO BE SOLVED: To obtain a terminal inspection jig for surely and inexpensively finding defects of a terminal, despite a simple structure. SOLUTION: This terminal inspection jig 1 is used to inspect a plurality of terminals 5 projecting from the bottom face of an electronic component 2 for bend or missing. The jig 1 has a plate material 6 as a compositional element. A thickness L2 of the plate material 6 is set slightly smaller than a length L1 of each terminal 5. A plurality of through-holes 7 for inserting the terminals 5 are made through the plate material 6 at positions corresponding to the terminals 5.</p>
申请公布号 JP2000077599(A) 申请公布日期 2000.03.14
申请号 JP19980247475 申请日期 1998.09.01
申请人 IBIDEN CO LTD 发明人 NAGAYA KUNIO
分类号 H01L23/50;H01L21/66;(IPC1-7):H01L23/50 主分类号 H01L23/50
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