Modified test module for integrated circuit is used to resynchronize circuit with clock and containing several independently developed modules

摘要

The test module (840) contains four multiplexers (843-846) and two flip-flops (841,842) and receives an input from a synchronous circuit (830) producing a clock signal (H1). This circuit has connections to the first and fourth multiplexers. The fourth multiplexer receives input signals (DI) from other modules.