Mixed IC tester used in testing mixed IC comprising of logic portion and memory portion

摘要

The mixed IC tester has a switching circuit (21) connected between several IC sockets (SK1-SK8) and a tested IC. The switching circuit selectively supplies a driving signal to the IC sockets for testing the memory portion and the logic portion of the IC. The IC comprises of predetermined driving channels. The required number of driving channels and pins for testing the memory portion of the IC is determined with the equivalent number of the IC sockets. The switching circuit changes its condition for testing the logic portion of the IC. An Independent claim is also included for the control procedure of the IC tester.