发明名称 HIGH-DENSITY CONTINUITY INSPECTION DEVICE
摘要 PROBLEM TO BE SOLVED: To provide an inspection device capable of inspecting the narrow-pitch wiring in an electric continuity inspection. SOLUTION: A sensor part 10 is composed of a substrate (a glass substrate) 11, a sensor area S is arranged on a center part of the substrate 11 and a driver area D is arranged on its edge part. A plurality of electrodes comprising metallic films are arranged on the sensor area S in a matrix condition. The pitch of a plurality of electrode pitches is smaller than the minimum pitch of the wiring pattern of a printed circuit board 30. An electrode (a) corresponding to a part A to be inspected of the printed circuit board 30 and an electrode (b) corresponding to a part B to be inspected are selected out of a plurality of electrodes, a test electric potential WTV is supplied to the part (a) to be inspected through the electrode (a), and the electric potential at the part B to be inspected is detected through the electrode (b).
申请公布号 JP2000065883(A) 申请公布日期 2000.03.03
申请号 JP19980237115 申请日期 1998.08.24
申请人 ASIA ELECTRONICS KK 发明人 KURATA SHIGEAKI
分类号 G01R31/02;G01R1/073;H05K3/00;(IPC1-7):G01R31/02 主分类号 G01R31/02
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