发明名称 APPARATUS AND METHOD FOR TREATING SUBSTRATE
摘要 PROBLEM TO BE SOLVED: To prevent occurrence of transfer as an index of unevenness of a resist fluid film thickness and fluctuation of the line width of a circuit pattern. SOLUTION: The substrate treatment apparatus coats the substrate G with a resist and dries it before heating treatment, exposure treatment, and development treatment. This apparatus comprises a resist coating treatment unit 22 for coating the substrate G with the resist and a vacuum drying unit 40 for vacuum drying the coated substrate and an end-face treatment unit 23 for removing the resist attached to the end faces of the substrate G after the vacuum drying.
申请公布号 JP2000056475(A) 申请公布日期 2000.02.25
申请号 JP19980233599 申请日期 1998.08.05
申请人 TOKYO ELECTRON LTD 发明人 SAKAI MITSUHIRO;TANAKA YUKINOBU;HONDA YOICHI;SHIMOMURA YUJI
分类号 G03F7/16;G02F1/1333;G03F7/38;H01L21/027 主分类号 G03F7/16
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