发明名称 |
APPARATUS AND METHOD FOR TREATING SUBSTRATE |
摘要 |
PROBLEM TO BE SOLVED: To prevent occurrence of transfer as an index of unevenness of a resist fluid film thickness and fluctuation of the line width of a circuit pattern. SOLUTION: The substrate treatment apparatus coats the substrate G with a resist and dries it before heating treatment, exposure treatment, and development treatment. This apparatus comprises a resist coating treatment unit 22 for coating the substrate G with the resist and a vacuum drying unit 40 for vacuum drying the coated substrate and an end-face treatment unit 23 for removing the resist attached to the end faces of the substrate G after the vacuum drying. |
申请公布号 |
JP2000056475(A) |
申请公布日期 |
2000.02.25 |
申请号 |
JP19980233599 |
申请日期 |
1998.08.05 |
申请人 |
TOKYO ELECTRON LTD |
发明人 |
SAKAI MITSUHIRO;TANAKA YUKINOBU;HONDA YOICHI;SHIMOMURA YUJI |
分类号 |
G03F7/16;G02F1/1333;G03F7/38;H01L21/027 |
主分类号 |
G03F7/16 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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