| 摘要 |
PURPOSE: A semiconductor part attachment is provided to achieve easy and correct coupling. CONSTITUTION: The attachment is used to test electrical characteristics of a semiconductor part and comprises a contactor with which the semiconductor part is contacted; a substrate supplying an electrical signal to the contactor; a plurality of coupling parts, fixed to the substrate, having an electrical terminal supplying the electrical signal to the substrate; a plurality of connectors, removably connected to each of the connecting parts, having a contact pin, a housing, and at least two compressors; a holer supporting a plurality of the connectors; and a plurality of fixers fixing a relative position of the substrate and the holder, wherein the contactor is contacted with the electrical terminal and is slided according to the terminal when the compressor presses the contact pin.
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