| 摘要 |
PROBLEM TO BE SOLVED: To enable the accurate specification of a location on the surface of a test piece at which a pad is to be adhered on the basis of transmitted light by adopting a transmitted light system. SOLUTION: A test piece photometric device has a light emitting element 35 for reflection to irradiate a test piece with light from the surface of the test piece on which a pad to show a color reaction is adhered, a light receiving element 36 to receive light irradiated from the light emitting element 35 for reflection and reflected at the pad, and a microcomputer to detect the level of reaction in the pad on the basis of the received light level of the reflected light received by the light receiving element 36. The test piece photometric device is provided with a back surface irradiating part 39 in which a light emitting element for transmission to irradiate light from the back surface side of the test piece for guiding transmitted light from the back surface side of the test piece to the light receiving element 36. On the basis of the received light level of the transmitted light irradiated from the light emitting element for transmission, transmitted through the test piece, and received at the light receiving element 36, the microcomputer specifies a location on the surface of the test piece at which the pad is to be adhered.
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