发明名称 Latch up protection and yield improvement device for IC array
摘要 The integrated circuits array with latch up protection includes an active array and a guard array. The active array contains a plurality of integrated circuits devices having operational functions. The guard array abutting an outer peripheral portion of the active array contains a plurality of transistors for protecting the plurality of integrated circuits devices from latch up. In general, the active array can be functional circuits like a memory array or a read only memory (ROM) array. The plurality of transistors in the guard array can be formed simultaneously with transistors in the active array and have same structure with the transistors.
申请公布号 US6028341(A) 申请公布日期 2000.02.22
申请号 US19980036817 申请日期 1998.03.09
申请人 UNITED MICROELECTRONICS CORP. 发明人 TAI, YU-CHIN;MOU, YA-NAN
分类号 H01L27/02;H01L27/112;(IPC1-7):H01L29/76;H01L29/94;H01L31/062;H01L31/113;H01L31/119 主分类号 H01L27/02
代理机构 代理人
主权项
地址