发明名称 |
TRUING DEVICE FOR WAFER POLISHING PAD |
摘要 |
PROBLEM TO BE SOLVED: To provide a truing device for a wafer polishing pad capable of stably truing a polishing pad by abutting a truing grinding wheel in parallel to the polishing pad. SOLUTION: A truing device 1 is provided with a truing grinding wheel part 2 having an abrasive grain layer 2a and a grinding wheel part supporting mechanism 5 for tiltably, turnably supporting the truing grinding wheel part 2. The truing grinding wheel part 2 is rotated by friction against a polishing pad 31 evolved by the rotation of the polishing pad 31. An abutting angle between the truing grinding wheel part 2 and the polishing pad 31 is controlled by an abutting angle controlling means having an arm rocking mechanism 7 and a rotating speed detecting means 9. The result stably trues the polishing pad 31. |
申请公布号 |
JP2000052230(A) |
申请公布日期 |
2000.02.22 |
申请号 |
JP19980218371 |
申请日期 |
1998.07.31 |
申请人 |
MITSUBISHI MATERIALS CORP;SAIBEKKU NANO TECHNOL INC |
发明人 |
KAJIWARA JIRO;KOMAZAKI MASAHITO;SANO HITOAKI;FUJIMOTO KENJI;ADACHI HITOSHI |
分类号 |
B24B53/017;H01L21/304 |
主分类号 |
B24B53/017 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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