发明名称 TRUING DEVICE FOR WAFER POLISHING PAD
摘要 PROBLEM TO BE SOLVED: To provide a truing device for a wafer polishing pad capable of stably truing a polishing pad by abutting a truing grinding wheel in parallel to the polishing pad. SOLUTION: A truing device 1 is provided with a truing grinding wheel part 2 having an abrasive grain layer 2a and a grinding wheel part supporting mechanism 5 for tiltably, turnably supporting the truing grinding wheel part 2. The truing grinding wheel part 2 is rotated by friction against a polishing pad 31 evolved by the rotation of the polishing pad 31. An abutting angle between the truing grinding wheel part 2 and the polishing pad 31 is controlled by an abutting angle controlling means having an arm rocking mechanism 7 and a rotating speed detecting means 9. The result stably trues the polishing pad 31.
申请公布号 JP2000052230(A) 申请公布日期 2000.02.22
申请号 JP19980218371 申请日期 1998.07.31
申请人 MITSUBISHI MATERIALS CORP;SAIBEKKU NANO TECHNOL INC 发明人 KAJIWARA JIRO;KOMAZAKI MASAHITO;SANO HITOAKI;FUJIMOTO KENJI;ADACHI HITOSHI
分类号 B24B53/017;H01L21/304 主分类号 B24B53/017
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