发明名称 PROBER AND METHOD FOR TOUCHING PROBE NEEDLE
摘要 PROBLEM TO BE SOLVED: To prevent an electric shortcircuit between terminals by absorbing a bend of a probe needle due to a stylus pressure. SOLUTION: A plurality of probe needles 7 integrally supported corresponding to terminals of a liquid crystal display panel 15 are correctly brought in touch with the terminals, thereby testing the terminals in this prober. The prober is provided with an inclination-absorbing means for absorbing an inclination between the probe needle 7 and the terminal due to a stylus pressure of the probe needle 7, thereby correctly bringing the probe needle in touch with the terminal. The inclination-absorbing means is constituted of a block lift mechanism 50 for supporting and moving the probe needle 7 up, down or, a probe block mount flexible part at a gate side or data side for integrally supporting the plurality of probe needles and changing a bend amount in accordance with a size of the stylus pressure of the probe needles. The probe needle groups separated to the gate side and data side are brought in touch with the terminals in an order from a larger stylus pressure and separated from the terminals in an order from a smaller stylus pressure.
申请公布号 JP2000046866(A) 申请公布日期 2000.02.18
申请号 JP19980209070 申请日期 1998.07.24
申请人 MICRONICS JAPAN CO LTD 发明人 MIURA KAZUYOSHI;TOGAWA YUZURU;HASEGAWA YOSHINOBU;FUKUSHI TOSHIO
分类号 G01R1/06;G01R31/28;G02F1/13;H01L21/66;(IPC1-7):G01R1/06 主分类号 G01R1/06
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