发明名称 EDDY-CURRENT FLAW DETECTOR PROBE
摘要 <p>An eddy-current flaw detector probe suitable for a nondestructive inspection comprises excitation coils (2, 2a, 2b) that generate eddy currents (12) in a test piece (10) by generating AC magnetic fields, and a pair of detection coils (1a, 1b) arranged in-phase and connected differentially. The pair of detection coils (1a, 1b) and the excitation coils (2, 2a, 2b) are arranged so that their centers may substantially coincide as viewed above the test piece (10). The difference in voltage due to the eddy currents (12) between the pair of detection coils (1a, 1b) is detected to find flaws in the test piece (10).</p>
申请公布号 WO2000008458(P1) 申请公布日期 2000.02.17
申请号 JP1999004232 申请日期 1999.08.05
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