| 摘要 |
PROBLEM TO BE SOLVED: To generate test programs for all patterns that are covered by a syntactic analysis table. SOLUTION: This test program generation system is provided with an input- output device 1 which inputs a test program condition and outputs a generated test program, a 1st storage device 3 which stores a syntactic analysis table and a declare statement, a data processor 2 which decides a syntax generation path based on the test program condition and the syntactic analysis table and also decides variables and constants of a test program and a 2nd storage device which stores the attribute information, program image information, access information and generation error information of the test program based on the decision of the processor 2. In such a case, the processor 2 generates a test program based on the information stored in the device 4.
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