| 摘要 |
The present invention provides a design method and apparatus for improving the testing of devices having status flags that indicate when particular boundary conditions are met. The present invention enables a subset of the overall device architecture that requires much less testing and vector analysis to fully analyze the device characteristics. The smaller subset of the device maximizes the number of in-depth analysis tests that can be run to provide a reliable tested device. After the tests are run on the smaller subset of the device, a smaller subset of tests may be executed on the entire full depth array with confidence that the in-depth tests have been previously executed. The present invention method and apparatus can be enabled during design, device characterization and production test phases of the product.
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