发明名称 |
NONVOLATILE MEMORY DEVICE |
摘要 |
PURPOSE: An NOR-type flat-cell mask ROM(read only memory) is provided to improve a uniformity of cells by decreasing a loading effect using a dummy line. CONSTITUTION: The memory device comprises a plurality of buried N+ diffusion layers(102) used as a sub bit line and of memory cell array and a source and drain of cell transistor formed on a semiconductor substrate(100); a plurality of word lines(104) cross of the buried N+ diffusion layer and formed on a gate dielectric(103) of the semiconductor substrate; a plurality of selective lines(B/L1, B/L2...) formed in parallel with the word lines(104) so as to selectively transport external signals to the sub bit line through a main bit line; and dummy line(105) formed in parallel with the word lines(104) at spaced region between the word lines adjacent to the selective lines.
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申请公布号 |
KR20000007429(A) |
申请公布日期 |
2000.02.07 |
申请号 |
KR19980026771 |
申请日期 |
1998.07.03 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
LEE, WOON GYUNG;LEE, YUN HO;KIM, EUI DO |
分类号 |
H01L27/115;G11C17/12;H01L21/8246;H01L27/112;(IPC1-7):H01L27/421 |
主分类号 |
H01L27/115 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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