发明名称 |
DIGITAL-ANALOG CONVERTER TEST DEVICE |
摘要 |
PURPOSE: A digital-analog converter test device is provided to enhance easily the resolution of a test device and upgrade it with ease by improving the sampling speed of an analog-digital converter. CONSTITUTION: The digital-analog converter test device comprises; a clock pulse generating part(10) to generate the 1st clock pulse(DA-CLK) and the 2nd clock pulse of which cycle is 1/n of that of the 1st clock pulse(AD CLK); a digital-analog converting part(20) to convert inputted N bit digital words into analog signals in response to the 1st clock pulse(DA CLK); an analog-digital converting part(40) to output N+2 bit digital words by digital converting the analog signal provided from the digital-analog converting part(10) by the 2nd clock pulse(AD CLK) cycle.
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申请公布号 |
KR20000007221(A) |
申请公布日期 |
2000.02.07 |
申请号 |
KR19980026432 |
申请日期 |
1998.07.01 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
HONG, KI JUNE;KIM, YONG SOCK;CHO, BYUNG HWAN |
分类号 |
H03M1/10;(IPC1-7):H03M1/10 |
主分类号 |
H03M1/10 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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