发明名称 Phasenschiebermaske und Verfahren zur Herstellung derselben
摘要 A phase shift mask and a method for fabrication of a phase shift mask provided with a groove formed by etching to a predetermined depth a portion of a transparent substrate on which an edge portion of a phase shift film pattern directly coated on the transparent substrate is disposed, thereby capable of preventing the phenomenon of an undesirable photoresist film residue being left upon a silicon substrate using a Levenson-type phase shift mask.
申请公布号 DE19501564(C2) 申请公布日期 2000.02.03
申请号 DE1995101564 申请日期 1995.01.19
申请人 HYUNDAI ELECTRONICS INDUSTRIES CO., LTD. 发明人 HAM, YOUNG MOG
分类号 G03F1/30;G03F1/68;H01L21/027 主分类号 G03F1/30
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