发明名称 Systems and methods for removing residue from process gases exhausted from microelectronic device fabrication processes
摘要 Process gases from microelectronic device fabrication processes are pumped through a filter unit including a plurality of absorbers for absorbing water entrained within the process gases. Residues deposited within the filtering unit are removed by spraying water on the absorbers. Water is prevented from escaping from the filtering unit into other portions of an exhaust gas system or into the environment by providing a curtain of pressurized, inert gas, within the filtering unit.
申请公布号 US6019816(A) 申请公布日期 2000.02.01
申请号 US19980086016 申请日期 1998.05.28
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LIM, YU-IL
分类号 H01L21/02;B01D53/04;B01D53/14;B01D53/68;(IPC1-7):B01D47/14 主分类号 H01L21/02
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