发明名称 |
METHOD AND APPARATUS FOR APPLYING RESIST |
摘要 |
PROBLEM TO BE SOLVED: To make uniform the thickness of resist formed on the surface of a wafer and to reduce the wastage of resists. SOLUTION: This method for coating the surface of a wafer 12, having a step on its surface with the resist 13, is characterized in that the surface of the wafer 12 is coated with the resist 13 by an ink jet system from a nozzle 11 which is capable of scanning the surface in an X and a Y-direction.
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申请公布号 |
JP2000031027(A) |
申请公布日期 |
2000.01.28 |
申请号 |
JP19980201767 |
申请日期 |
1998.07.16 |
申请人 |
NKK CORP |
发明人 |
SAITO HIROMICHI;NISHIGAYA TAKEHIKO |
分类号 |
B05D1/40;B05C11/08;H01L21/027;(IPC1-7):H01L21/027 |
主分类号 |
B05D1/40 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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