发明名称 METHOD AND APPARATUS FOR APPLYING RESIST
摘要 PROBLEM TO BE SOLVED: To make uniform the thickness of resist formed on the surface of a wafer and to reduce the wastage of resists. SOLUTION: This method for coating the surface of a wafer 12, having a step on its surface with the resist 13, is characterized in that the surface of the wafer 12 is coated with the resist 13 by an ink jet system from a nozzle 11 which is capable of scanning the surface in an X and a Y-direction.
申请公布号 JP2000031027(A) 申请公布日期 2000.01.28
申请号 JP19980201767 申请日期 1998.07.16
申请人 NKK CORP 发明人 SAITO HIROMICHI;NISHIGAYA TAKEHIKO
分类号 B05D1/40;B05C11/08;H01L21/027;(IPC1-7):H01L21/027 主分类号 B05D1/40
代理机构 代理人
主权项
地址