发明名称 FLUORESCENT FLAW DETECTION AND DEVICE THEREFOR
摘要 PROBLEM TO BE SOLVED: To eliminate an adverse effects due to ultraviolet light, and to allow working under a light atmosphere. SOLUTION: In this flaw detection method in which a specimen is imparted beforehand with a luminescence material for flaw detection, it is irradiated with an excited light from an exciting light source, and by which a defect of the specimen is detected based on a luminous condition of fluorescence emitted from the luminescence material excited by irradiation of the exciting light, blue light sources 17a, 17b,..., 27 emitting blue light having about 460 nm for the wavelength are used for the fluorescent exciting light source, and luminescence materials 16, 26 which are prepared by selecting a fluorescent material (a fluorescent pigment, a fluorescent dye, or the like) excited by the blue light to emit red light having about 630 nm of wavelength, and by mixing integrally the fluorescent material and an imparting medium (magnetic powder, a penetrant or the like) for imparting to the specimens 11, 21 with the fluorescent material are used for the luminescence materials.
申请公布号 JP2000028548(A) 申请公布日期 2000.01.28
申请号 JP19980197301 申请日期 1998.07.13
申请人 DENSHI JIKI KOGYO KK 发明人 DOMON HITOSHI
分类号 G01N21/91;G01N27/84;(IPC1-7):G01N21/91 主分类号 G01N21/91
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